Atomic-resolution TEM of electron beam sensitive cry
High-resolution imaging of electron beam-sensitive crystalline materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with an extremely low beam dose, the time-constrained search for crystal zone axes, the precise alignment of successive images, and the accurate determination of the defo...
活动时间:
2018-04-27 14:00
主讲人:张玉